Temperature dependence of spectroscopic performance of thallium bromide X- and gamma-ray detectors

IEEE Transactions on Nuclear Science

Volumn 54, Issue 4, 2007, Pages 860-863

  Onoclera, Toshiyuki ^a   Hitomi, Keitaro ^a   Shoji, Taclayoshi ^a  

^a TOHOKU INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

Compound semiconductors; Gamma ray detectors; Spectroscopic performance; Thallium bromide (TlBr)

Indexed keywords

CRYSTAL GROWTH; ENERGY GAP; GAMMA RAYS; SEMICONDUCTOR MATERIALS; SPECTROSCOPIC ANALYSIS; THALLIUM COMPOUNDS; THERMAL EFFECTS; X RAYS;

GAMMA RAY DETECTORS; SPECTROSCOPIC PERFORMANCE; THALLIUM BROMIDE (TLBR);

RADIATION DETECTORS;

EID: 34548090144     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2007.902703     Document Type: Conference Paper

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