Characterization of low-defect Cd0.9Zn0.1Te and CdTe crystals for high-performance frisch collar detectors

IEEE Transactions on Nuclear Science

Volumn 54, Issue 4, 2007, Pages 802-806

  Mandal, Krishna C ^b   Kang, Sung H ^b   Choi, Michael ^b   Kargar, Alireza ^c   Harrison, Mark J ^c   McGregor, Douglas S ^a,c   Bolotnikov, A E ^a,d   Carini, G A ^a,d   Camarda, G C ^d   James, R B ^a,d  

^a IEEE

^b EIC LABORATORIES INC   (United States)

^c Kansas State University   (United States)

^d BROOKHAVEN NATIONAL LABORATORY   (United States)

Author keywords

Cd0.9 Zn0.1 Te; CdTe; Frisch collar; Low defect density; Semiconductor detectors

Indexed keywords

CADMIUM ALLOYS; CONCENTRATION (PROCESS); CRYSTAL DEFECTS; CRYSTAL GROWTH; INCLUSIONS; INFRARED TRANSMISSION; OPTIMIZATION; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR DETECTORS;

HIGH PERFORMANCE FRISCH COLLAR DETECTORS; LOW DEFECT DENSITY;

CRYSTALS;

EID: 34548076006     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2007.902371     Document Type: Conference Paper

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