Analysis of SEE-inducing charge generation in the neutron beam at the svedberg laboratory

IEEE Transactions on Nuclear Science

Volumn 54, Issue 4, 2007, Pages 1163-1169

  Platt, S P ^a,b   Torok Z ^a,b  

^a IEEE

^b UNIVERSITY OF CENTRAL LANCASHIRE   (United Kingdom)

Author keywords

Charge coupled devices; Dosimetry; Neutron beams; Neutron radiation effects

Indexed keywords

CHARGE COUPLED DEVICES; DOSIMETRY; ELECTRIC CHARGE; FLUXES; RADIATION EFFECTS;

CHARGE COLLECTION; CHARGE-GENERATION; SINGLE-EVENT EFFECT (SEE);

NEUTRON BEAMS;

EID: 34548061459     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2007.902366     Document Type: Conference Paper

References (25)

1. "Measurement and reporting of alpha particles and terrestrial cosmic ray-induced soft errors in semiconductor devices," JEDEC Solid State Technology Assoc., Std. JESD89, 2001 [Online]. Available: http://www.jedec.org/ download/search/jesd89.pdf
2. B. Takala and S. A. Wender, "Accelerated neutron testing of semiconductor devices." [Online]. Available: http://wnr.lanl.gov/see/ poster.pdf
3. A. V. Prokofiev, L.-O. Andersson, T. Bergmark, O. Byström, H. Calén, L. Einarsson, C. Ekström, J. Fransson, K. Gajewski, N. Haag, T. Hartman, E. Hellbeck, T. Johansen, O. Jonsson, B. Lundström, L. Pettersson, D. Reistad, P.-U. Renberg, D. Wessman, V. Ziemann, J. Blomgren, S. Pomp, A. Österlund, and U. Tippawan, "A new neutron facility for single-event effect testing," in Proc. IEEE Radiation Effects Data Workshop, Jul. 2004, pp. 160-162.
4. "Process management for avionics-Atmospheric radiation effects-Part 1: Accomodation of atmospheric radiation effects via single event effects within avionics electronic equipment," Int. Electrotech. Commission, Std. IEC/TS 62396-1, Rev. 1.0, 2006.
5. C. S. Dyer, S. N. Clucas, C. Sanderson, A. D. Frydland, and R. T. Green, "An experimental study of single-event effects induced in commercial SRAMs by neutrons and protons from thermal energies to 500 MeV," IEEE Trans. Nucl. Sci., vol. 51, no. 5, pp. 2817-2824, Oct. 2004.
6. D. Lambert, J. Baggio, G. Hubert, P. Paillet, S. Girard, V. Ferlet-Cavrois, O. Flament, F. Saigné, J. Boch, B. Sagnes, N. Buard, and T. Carrière, "Analysis of quasi-monoenergetic neutron and proton SEU cross sections for terrestrial applications," IEEE Trans. Nucl. Sci., vol. 53, no. 4, pp. 1890-1896, Aug. 2006.
7. C. Dyer, A. Hands, K. Ford, A. Frydland, and P. Truscott, "Neutroninduced single event effects testing across a wide range of energies and facilities and implications for standards," IEEE Trans. Nucl. Sci., vol. 53, no. 12, pp. 3596-3601, Dec. 2006.
8. K. Johansson, P. Dyreklev, B. Granbom, N. Olsson, J. Blomgren, and P.-U. Renberg, "Energy-resolved neutron SEU measurements from 22 to 160 MeV," IEEE Trans. Nucl. Sci., vol. 45, no. 12, pp. 2519-2526, Dec. 1998.
9. T. Granlund, B. Granbom, and N. Olsson, "A comparative study between two neutron facilities regarding SEU," IEEE Trans. Nucl. Sci., vol. 51, no. 10, pp. 2922-2926, Oct. 2004.
10. M. Olmos, A. Prokofiev, and R. Gaillard, "Unfolding procedure for SER measurements using quasi-monoenergetic neutrons," in Proc. 43rd Ann. IEEE Int. Rel. Phys. Symp., Apr. 2005, pp. 696-697.
11. Y. Yahagi, E. Ibe, Y. Takahashi, Y. Saito, A. Eto, M. Sato, H. Kameyama, M. Hidaka, K. Terunuma, T. Nunomiya, and T. Nakamura, "Threshold energy of neutron-induced single event upset as a critical factor," in Proc. 42nd Ann. IEEE Int. Rel. Phys. Symp., 2004, pp. 669-670.
12. Z. Török and S. P. Piatt, "Application of imaging systems to characterization of single-event effects in high-energy neutron environments," IEEE Trans. Nucl. Sci, vol. 53, no. 12, pp. 3718-3725, Dec. 2006.
13. P. Truscott, F. Lei, C. S. Dyer, A. Frydland, S. Clucas, B. Trousse, K. Hunter, C. Comber, A. M. Chugg, and M. Moutrie, "Assessment of neutron- and proton-induced nuclear interaction and ionization models in Geant4 for simulating single event effects," IEEE Trans. Nucl. Sci., vol. 51, no. 12, pp. 3369-3374, Dec. 2004.
14. P. Truscott, C. Dyer, A. Frydland, A. Hands, S. Clucas, and K. Hunter, "Neutron energy-deposition spectra measurements, and comparisons with Geant4 predictions," IEEE Trans. Nucl. Sci., vol. 53, no. 4, pp. 1883-1889, Aug. 2006.
15. S. El-Teleaty, G. E. Farrell, and P. J. McNulty, "Charge-deposition spectra in thin slabs of silicon induced by energetic protons," IEEE Trans. Nucl. Sci., vol. 30, no. 6, pp. 4394-4397, Dec. 1983.
16. E. Normand, D. L. Oberg, J. L. Wert, P. P. Majewski, G. A. Woffinden, S. Satoh, K. Sasaki, M. G. Tverskoy, V. V. Miroshkin, N. Goleminov, S. A. Wender, and A. Gavron, "Comparison and implications of charge collection measurements in silicon and InGaAs irradiated by energetic protons and neutrons," IEEE Trans. Nucl. Sci., vol. 42, no. 6, pp. 1815-1822, Dec. 1995.
17. A. M. Chugg, R. Jones, M. J. Moutrie, C. S. Dyer, K. A. Ryden, P. R. Truscott, J. R. Armstrong, and D. B. S. King, "Analyses of CCD images of nucleon-silicon interaction events," IEEE Trans. Nucl. Sci., vol. 51, no. 5, pp. 2851-2856, Oct. 2004.
18. S. P. Platt, B. Cassels, and Z. Török, "Development and application of a neutron sensor for single event effects analysis," in J. Phys.: Conf. Ser., 2005, vol. 15, pp. 172-176 [Online]. Available: http://stacks.iop.org/1742-6596/15/172
19. A. M. Chugg, R. Jones, M. J. Moutrie, and P. R. Truscott, "Analyses of images of neutron interactions and single particle displacement damage in CCD arrays," IEEE Trans. Nucl. Sci., vol. 51, no. 6, pp. 3579-3584, Dec. 2004.
20. A. V. Prokofiev, Personal Communication, May 2006.
21. B. E. Takala, Personal Communication, Mar. 2006.
22. J. Baggio, V. Ferlet-Cavrois, H. Duarte, and O. Flament, "Analysis of proton/neutron SEU sensitivity of commercial SRAMs - Application to the terrestrial environment test model," IEEE Trans. Nucl. Sci., vol. 51, no. 6, pp. 3420-3426, Dec. 2004.
23. D. Lambert, Personal Communication, Dec. 2006.
24. E. Blackmore, P. Dodd, and M. Shaneyfelt, "Improved capabilities for proton and neutron irradiations at TRIUMF," in Proc. IEEE Radiation Effects Data Workshop, 2003, pp. 149-155.
25. A. Lesea, S. Drimer, J. J. Fabula, C. Carmichael, and P. Alike, "The rosetta experiment: Atmospheric soft error rate testing in differing technology FPGAs," IEEE Trans. Device Mat. Rel., vol. 5, no. 3, pp. 317-328, Sep. 2005.