Ultra-short pulsed laser-induced damage in inorganic silicon materials

Zhongguo Jiguang/Chinese Journal of Lasers

Volumn 34, Issue 7, 2007, Pages 1009-1013

  Li, Yu Hua ^a   Ma, Fa Jun ^a   Dai, Neng Li ^a   Yang, Guang ^a   Lu, Pei Xiang ^a  

^a HUAZHONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (China)

Author keywords

Damage; Femtosecond laser; Inorganic silicon; Materials; Scanning electron microscopy

Indexed keywords

CHARGE COUPLED DEVICES; FUSED SILICA; LASER PULSES; SCANNING ELECTRON MICROSCOPY; SILICON WAFERS; ULTRASHORT PULSES;

FEMTOSECOND LASER; INORGANIC SILICON; LASER INDUCED DAMAGE; MULTIPHOTON IONIZATION; TRANSPARENT MATERIALS;

LASER DAMAGE;

EID: 34547972869     PISSN: 02587025     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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