Paving the way for novel top-emitting AMOLED architecture through new cathode and ETL materials

Digest of Technical Papers - SID International Symposium

Volumn 38, Issue 1, 2007, Pages 1695-1697

  Lee, Jong Hyuk ^a   Kim, Won Jong ^a   Yang, Seung Gak ^a   Lee, Chang Ho ^a   Kim, Yong Tak ^a   Shin, Jung Han ^a   Choi, Jin Baek ^a   Kim, Hee Yeon ^a   Ko, Hee Joo ^a   Zang, Dong Sik ^a   Chung, Ho Kyun ^a  

^a Samsung SDI   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

CATHODES; DEPOSITION; ELECTRIC CONDUCTIVITY; ELECTRON TRANSPORT PROPERTIES; MICROCAVITIES;

ETL MATERIALS; ORGANIC LAYERS;

ORGANIC LIGHT EMITTING DIODES (OLED);

EID: 34547945987     PISSN: 0097966X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1889/1.2785651     Document Type: Conference Paper

References (3)

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2. T.Y Chu, J.F Chen, S.Y Chen, C.J. Chen, C.H.Chen, "High Efficient and stable inverted bottom-emission organic light emitting devices" SID Symposium Digest, pp. 1288-1291, 2006.
3. L.S.Liao, I.S.Hung, W.C.Chan, X.M.Ding, T.K.Sham, I.Bello, C.S.Lee and S.T.Lee, "Ion-beam-induced surface damages on tri-(8-hydroxyquinoline) aluminum" Appl. Phys. Lett., Vol. 75. pp. 1619-1621, 1999.