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Volumn 46, Issue 1, 2007, Pages 71-75

Growth and energy bandgap formation of silicon nitride films in radical nitridation

Author keywords

Energy bandgap; Radical nitridation; Scanning tunneling microscopy; Scanning tunneling spectroscopy; Silicon nitride

Indexed keywords

ENERGY GAP; FILM GROWTH; NITRIDATION; SCANNING TUNNELING MICROSCOPY; SILICON NITRIDE;

EID: 34547909978     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.46.71     Document Type: Article
Times cited : (6)

References (18)
  • 10
    • 34547858922 scopus 로고    scopus 로고
    • International Technology Roadmap for Semiconductors, 2002 edition.
    • International Technology Roadmap for Semiconductors, 2002 edition.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.