Local crystal structures of Ge2Sb2Te5 revealed by the atomic pair distribution function analysis

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 45, Issue 11, 2006, Pages 8789-8794

  Shamoto, Shin Ichi ^a   Kodama, Katsuaki ^a   Iikubo, Satoshi ^a   Taguchi, Tomitsugu ^a   Yamada, Noboru ^b   Proffen, Thomas ^c  

^a JAPAN ATOMIC ENERGY AGENCY   (Japan)

^b PANASONIC CORPORATION   (Japan)

^c LOS ALAMOS NATIONAL LABORATORY   (United States)

Author keywords

Band calculation; DVD; Ge2Sb2Te5; Optical recording material; PDF; Rietveld analysis

Indexed keywords

BAND STRUCTURE; NEUTRON POWDER DIFFRACTION; OPTICAL RECORDING; RIETVELD ANALYSIS; SEMICONDUCTING GERMANIUM COMPOUNDS; X RAY POWDER DIFFRACTION;

BAND CALCULATION; OPTICAL RECORDING MATERIALS; PAIR DISTRIBUTION FUNCTION (PDF);

CRYSTAL STRUCTURE;

EID: 34547901444     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.45.8789     Document Type: Article

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