Controlled growth of high-quality TiO2 nanowires on sapphire and silica

Nanotechnology

Volumn 17, Issue 17, 2006, Pages 4317-4321

  Lee, Jung Chul ^a   Park, Kyung Soo ^a   Kim, Tae Geun ^a   Choi, Heon Jin ^b   Sung, Yun Mo ^a  

^a Korea University   (South Korea)

^b Yonsei University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

BUFFER LAYERS; CATALYSIS; CATALYSTS; CORUNDUM; CRYSTAL STRUCTURE; CRYSTALLINE MATERIALS; DIFFRACTION; ELECTRIC WIRE; EPITAXIAL LAYERS; FIELD EMISSION; HIGH RESOLUTION ELECTRON MICROSCOPY; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; LIGHT EMISSION; LUMINESCENCE; MICROSCOPIC EXAMINATION; NANOSTRUCTURED MATERIALS; NANOSTRUCTURES; NANOWIRES; OPTICAL WAVEGUIDES; OXIDE MINERALS; QUARTZ; SAPPHIRE; SILICA; SILICON COMPOUNDS; TITANIUM OXIDES; X RAY ANALYSIS;

AU CATALYSTS; CONTROLLED GROWTHS; CRYSTALLINITY; FIELD EMISSION SCANNING ELECTRON MICROSCOPIES; GAS FLOWS; GROWTH DIRECTIONS; HIGH DENSITIES; HIGH RESOLUTIONS; MORPHOLOGICAL FEATURES; PHOTOLUMINESCENCE EMISSIONS; PL PROPERTIES; QUARTZ SUBSTRATES; RUTILE STRUCTURES; SELECTED AREA ELECTRON DIFFRACTIONS; TWIN STRUCTURES; X-RAY DIFFRACTIONS;

SUBSTRATES;

GOLD; NANOWIRE; SILICON DIOXIDE; TITANIUM DIOXIDE;

ARTICLE; CRYSTAL; CRYSTALLIZATION; DIFFRACTION; EVAPORATION; FIELD EMISSION SCANNING ELECTRON MICROSCOPY; GAS FLOW; LIQUID; NANOFABRICATION; NONHUMAN; PHASE TRANSITION; PHOTOLUMINESCENCE; PRIORITY JOURNAL; QUALITY CONTROL; SAPPHIRE; SELECTED AREA ELECTRON DIFFRACTION ANALYSIS; SOLID; SPECTRAL SENSITIVITY; TRANSMISSION ELECTRON MICROSCOPY; VAPOR; X RAY DIFFRACTION;

EID: 34547886701     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/17/17/006     Document Type: Article

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