A new scheme for imaging on-chip dry DNA spots using optical/potential dual-image complementary metal oxide semiconductor sensor

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 46, Issue 4 B, 2007, Pages 2806-2810

  Tokuda, Takashi ^a   Kadowaki, Issei ^a   Kagawa, Keiichiro ^a   Nunoshita, Masahiro ^a   Ohta, Jun ^a  

^a NARA INSTITUTE OF SCIENCE AND TECHNOLOGY   (Japan)

Author keywords

CMOS image sensor; DNA microarray; On chip potential image

Indexed keywords

CMOS INTEGRATED CIRCUITS; DIELECTRIC PROPERTIES; DNA; ELECTROCHEMICAL ELECTRODES; IMAGE SENSORS;

DNA SPOTS; DUAL-IMAGE SENSOR; ON-CHIP POTENTIAL IMAGE;

MICROARRAYS;

EID: 34547864661     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.46.2806     Document Type: Article

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