Structure and high temperature thermoelectric properties of delafossite-type oxide CuFe1-xNixO2 (0 ≤ x ≤ 0.05)

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 46, Issue 8 A, 2007, Pages 5226-5229

  Hayashi, Kei ^a,b   Nozaki, Tomohiro ^a,b   Kajitani, Tsuyoshi ^a,b  

^a TOHOKU UNIVERSITY   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

Delafossite; Thermoelectric properties; X ray diffraction

Indexed keywords

CRYSTAL STRUCTURE; ELECTRIC CONDUCTIVITY; LATTICE CONSTANTS; THERMOELECTRICITY; X RAY DIFFRACTION;

CONSTITUENT ELEMENTS; MAXIMUM DIMENSIONLESS FIGURE; THERMOELECTRIC PROPERTIES;

COPPER COMPOUNDS;

EID: 34547857786     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.46.5226     Document Type: Article

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