Reduction of shorting defects in OLED devices

Digest of Technical Papers - SID International Symposium

Volumn 38, Issue 1, 2007, Pages 845-848

  Tyan, Yuan Sheng ^a   Farruggia, Giuseppe ^a   Cushman, Thomas R ^a  

^a EASTMAN KODAK COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEFECTS; ELECTRIC CURRENTS; ELECTRIC RESISTANCE; ELECTRODES; THIN FILMS;

DETRIMENTAL EFFECTS; SHORTING DEFECTS;

ORGANIC LIGHT EMITTING DIODES (OLED);

EID: 34547855556     PISSN: 0097966X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1889/1.2785440     Document Type: Conference Paper

References (4)

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2. M. Bender, "Method for producing smooth Indium-tin-oxide layers on substrates and a substrate coating of indium-tin-oxide", U.S. Patent 7,041,588 B2, 2006.
3. J.-S. Cho, Y.-G. Han, Y.-W. Beag, S.-K. Koh "Method of forming ITO film", U.S. Patent Application 2004/0140198 Al.
4. 2O", Jpn. J. Appl. Phys., Vol. 45 (12), pp. 9219-9223, 2006.