Ab initio calculations of strain fields and failure patterns in silicon nitride intergranular glassy films

Philosophical Magazine

Volumn 87, Issue 25, 2007, Pages 3839-3852

  Misra, A ^a   Ouyang, L ^b   Chen, J ^a   Ching, W Y ^a  

^a UNIVERSITY OF MISSOURI KANSAS CITY   (United States)

^b TENNESSEE STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FAILURE ANALYSIS; GRADIENT METHODS; LOADS (FORCES); MATHEMATICAL MODELS; STRAIN MEASUREMENT;

FAILURE PATTERNS; INTERGRANULAR GLASSY FILMS; STRAIN FIELDS; TENSILE LOADING;

SILICON NITRIDE;

EID: 34547844075     PISSN: 14786435     EISSN: 14786443     Source Type: Journal    
DOI: 10.1080/14786430701422206     Document Type: Article

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