Study of the growth conditions and characterization of CaCu2Ox and SrCu2Ox thin films

Surface and Coatings Technology

Volumn 201, Issue 22-23 SPEC. ISS., 2007, Pages 9395-9399

  Millon, C ^a   Deschanvres, J L ^a   Jimenez C ^a   Macsporran, N ^a   Servet, B ^b   Durand, O ^b   Modreanu, M ^c  

^a LABORATOIRE DES MATÉRIAUX ET DU GÉNIE PHYSIQUE   (France)

^b THALES RESEARCH AND TECHNOLOGY   (France)

^c UNIVERSITY COLLEGE CORK   (Ireland)

Author keywords

Thin films; Transparent conductive oxides; XRD

Indexed keywords

CALCIUM; METALLORGANIC CHEMICAL VAPOR DEPOSITION; RAPID THERMAL PROCESSING; STRONTIUM; STRUCTURAL PROPERTIES;

DEPOSITION TEMPERATURE; OXYGEN PARTIAL PRESSURE; TRANSPARENT CONDUCTIVE OXIDE THIN FILMS;

CONDUCTIVE FILMS;

CALCIUM; CONDUCTIVE FILMS; METALLORGANIC CHEMICAL VAPOR DEPOSITION; RAPID THERMAL PROCESSING; STRONTIUM; STRUCTURAL PROPERTIES;

EID: 34547813624     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.surfcoat.2007.04.121     Document Type: Article

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