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Volumn 14, Issue 4, 2007, Pages 803-812

Stochastic nature of electrical breakdown in vacuum

Author keywords

Probability; Vacuum breakdown mechanism; Vacuum circuit breakers; Vacuum diodes

Indexed keywords

ELECTRIC CIRCUIT BREAKERS; ELECTRIC POTENTIAL; PARAMETER ESTIMATION; PROBABILITY DISTRIBUTIONS; RANDOM VARIABLES; STOCHASTIC CONTROL SYSTEMS; VACUUM;

EID: 34547789801     PISSN: 10709878     EISSN: None     Source Type: Journal    
DOI: 10.1109/TDEI.2007.4286510     Document Type: Conference Paper
Times cited : (15)

References (17)
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  • 3
    • 0028405887 scopus 로고
    • Influence of Switching on the Vacuum Interrupter Dielectric Properties
    • P. Osmokrović, "Influence of Switching on the Vacuum Interrupter Dielectric Properties", IEEE Trans. Dielectr. Electr. Insul., Vol. 1, pp. 340-347, 1994.
    • (1994) IEEE Trans. Dielectr. Electr. Insul , vol.1 , pp. 340-347
    • Osmokrović, P.1
  • 4
    • 0024889007 scopus 로고
    • Statistical Properties of Electrical Breakdown in Vacuum
    • G. Dogo and P. Osmokrović, "Statistical Properties of Electrical Breakdown in Vacuum", IEEE Trans. Electr. Insul., Vol. 24, pp. 949-953, 1989.
    • (1989) IEEE Trans. Electr. Insul , vol.24 , pp. 949-953
    • Dogo, G.1    Osmokrović, P.2
  • 8
    • 0026189549 scopus 로고
    • The Irreversibility of Dielectric Strength of Vacuum Interrupters After Short-Circuit Current Interruption
    • P. Osmokrovič, " The Irreversibility of Dielectric Strength of Vacuum Interrupters After Short-Circuit Current Interruption", IEEE Trans. Power Del., Vol. 6, pp. 1073-1081, 1991.
    • (1991) IEEE Trans. Power Del , vol.6 , pp. 1073-1081
    • Osmokrovič, P.1
  • 9
    • 0006672629 scopus 로고
    • Statistical Techniques for High-Voltage Engineering
    • IEEE Power, Peter Peregrinus Ltd
    • W. Hauschild and W. Mosch, Statistical Techniques for High-Voltage Engineering, IEEE Power Series 13, Peter Peregrinus Ltd., 1992.
    • (1992) Series , vol.13
    • Hauschild, W.1    Mosch, W.2
  • 13
    • 0032291412 scopus 로고    scopus 로고
    • The Effects of Electrode Cleaning and Conditioning on the Performance of High-Energy, Pulsed-Power Devices
    • M. E. Cuneo, "The Effects of Electrode Cleaning and Conditioning on the Performance of High-Energy, Pulsed-Power Devices", XVIIIth Intern. Sympos. Discharges and Electrical Insulation in Vacuum, Vol. 2, pp. 721-730, 1998.
    • (1998) XVIIIth Intern. Sympos. Discharges and Electrical Insulation in Vacuum , vol.2 , pp. 721-730
    • Cuneo, M.E.1
  • 14
    • 0034472269 scopus 로고    scopus 로고
    • Behavior of Conductive Microparticles Under Electric Field in Vacuum and Their Influence on Breakdown Characteristics
    • S. Sato, K. Koyama and H. Fujii, "Behavior of Conductive Microparticles Under Electric Field in Vacuum and Their Influence on Breakdown Characteristics", XIXth Intern. Sympos. Discharges and Electrical Insulation in Vacuum, Vol. 1, pp. 25-28, 2000.
    • (2000) XIXth Intern. Sympos. Discharges and Electrical Insulation in Vacuum , vol.1 , pp. 25-28
    • Sato, S.1    Koyama, K.2    Fujii, H.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.