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Volumn 579, Issue 2 SPEC. ISS., 2007, Pages 886-890

Amorphous-semiconductor-contact germanium-based detectors for gamma-ray imaging and spectroscopy

Author keywords

Gamma ray imaging; Gamma ray spectroscopy; Germanium detector; Orthogonal strip; Position sensing

Indexed keywords

AMORPHOUS SEMICONDUCTORS; ELECTRIC CONTACTS; GAMMA RAY SPECTROMETERS; IMAGE RESOLUTION; NUCLEAR PHYSICS;

EID: 34547787197     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2007.05.307     Document Type: Article
Times cited : (61)

References (18)
  • 13
    • 34547798503 scopus 로고    scopus 로고
    • P.N. Luke, M. Amman, J.S. Lee, J.T. Walton, Amorphous-Ge and amorphous-Si contacts on Ge detectors, Presented at the IEEE Nuclear Science Symposium in Toronto, Ontario, Canada, 1998.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.