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Volumn 22, Issue 2-3, 2007, Pages 83-92

Crack growth induced by sonic IR inspection

Author keywords

Crack propagation; Fatigue; Sonic IR; Thermal acoustic

Indexed keywords

CRACKS; FATIGUE CRACK PROPAGATION; STRESS INTENSITY FACTORS;

EID: 34547740035     PISSN: 10589759     EISSN: 14772671     Source Type: Journal    
DOI: 10.1080/10589750701447672     Document Type: Article
Times cited : (27)

References (10)
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  • 2
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    • Chen, J.C., Kephart, J. and Riddell, W.T., A parametric study of crack propagation during sonic IR inspection. In Review of Progress in QNDE, 25B, AIP Conference Proceedings edited by D.O. Thompson and D.E. Chimenti, 820, pp. 1577-1584, 2006 (American Institute of Physics: Melville, NY).
    • Chen, J.C., Kephart, J. and Riddell, W.T., A parametric study of crack propagation during sonic IR inspection. In Review of Progress in QNDE, 25B, AIP Conference Proceedings edited by D.O. Thompson and D.E. Chimenti, Vol. 820, pp. 1577-1584, 2006 (American Institute of Physics: Melville, NY).
  • 4
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    • Acoustic chaos and sonic infrared imaging
    • Han, X., Li, W., Zeng, Z., Favro, L.D. and Thomas, R.L., Acoustic chaos and sonic infrared imaging. Appl. Phys. Lett., 2002, 81(17), 3188-3190.
    • (2002) Appl. Phys. Lett , vol.81 , Issue.17 , pp. 3188-3190
    • Han, X.1    Li, W.2    Zeng, Z.3    Favro, L.D.4    Thomas, R.L.5
  • 6
    • 34547784215 scopus 로고
    • Assessment of damage tolerance requirements and analyses - tasks II and IV report, AFWAL-TR-86-3003
    • Data
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  • 7
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    • Thermographic investigation of high-power ultrasonic heating in materials
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    • (1981) Ultrasonics , vol.19 , pp. 159-163
    • Mignogna, R.B.1    Green, R.E.2    Duke, J.C.3    Henneke, E.G.4    Reifsnider, K.L.5
  • 8
    • 0031996745 scopus 로고    scopus 로고
    • NDT of polymer materials using lock-in thermography with water-coupled ultrasonic excitation
    • Rantala, J., Wu, D. and Busse, G., NDT of polymer materials using lock-in thermography with water-coupled ultrasonic excitation. NDT&E Int., 1998, 31(1), 43-49.
    • (1998) NDT&E Int , vol.31 , Issue.1 , pp. 43-49
    • Rantala, J.1    Wu, D.2    Busse, G.3
  • 10
    • 34248542812 scopus 로고    scopus 로고
    • Infrared imaging of ultrasonically excited subsurface defects in materials,
    • US Patent 6,236,049. May 22 et al, 2001
    • Thomas, Infrared imaging of ultrasonically excited subsurface defects in materials, US Patent 6,236,049. May 22 et al., 2001.
    • Thomas1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.