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Volumn 579, Issue 1, 2007, Pages 79-82

Principle and applications of Controlled-Drift Detectors

Author keywords

Compton imaging; Controlled Drift Detectors; X ray imaging; X ray spectroscopy

Indexed keywords

IMAGE ANALYSIS; X RAY ANALYSIS; X RAY SPECTROSCOPY;

EID: 34547689738     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2007.04.059     Document Type: Article
Times cited : (4)

References (15)
  • 3
    • 34547716722 scopus 로고    scopus 로고
    • E.U. Patent no. EP0862226, US Patent no. US 6,249,033
  • 13
    • 0031366929 scopus 로고    scopus 로고
    • C.E. Ordonez, A. Bolozdynya, W. Chang, in: Proceedings of the IEEE Nuclear Science Symposium, 1997, p. 1361.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.