A multi-scale approach of roughness measurements: Evaluation of the relevant scale

Materials Science and Engineering C

Volumn 27, Issue 5-8 SPEC. ISS., 2007, Pages 1434-1438

  Van Gorp, A ^a,b   Bigerelle, M ^b   Grellier, A ^c   Iost, A ^a   Najjar, D ^a  

^a UNIVERSITÉ LILLE 1   (France)

^b UNIVERSITÉ DE TECHNOLOGIE DE COMPIÈGNE   (France)

^c Aubert and Duval Groupe Recherche et Développement 63770 Les Ancizes ^*  (France)

Author keywords

Multi scale analysis; Roughness measurement; Variance analysis

Indexed keywords

PROFILOMETRY; ROUGHNESS MEASUREMENT; VARIATIONAL TECHNIQUES; WAVELENGTH;

MULTI SCALE ANALYSIS; OPTIMAL CORRELATION; POLYNOMIAL FITTING; VARIANCE ANALYSIS;

SURFACE ROUGHNESS;

EID: 34547666988     PISSN: 09284931     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.msec.2006.09.041     Document Type: Article

References (12)

1. Schützer K., Helleno A.L., and Pereira S.C. J. Mater. Process. Technol. 179 (2006) 172
2. Terminology of Defects in Glass, ed. Sub-committee A1 of the International Commission on Glass, Offenbach, Germany (1969)
3. Ernsberger F.M. Annu. Rev. Mater. Sci. 2 (1972) 529
4. Hennebelle F., Najjar D., Bigerelle M., and Iost A. Prog. Org. Coat. 56 (2006) 81
5. Benoist D., Tourbier Y., and Germain-Tourbier S. Plans d'expériences - Construction et Analyse (1995), Tec and Doc Ed, Paris
6. Dubuc D., Quiniou J.F., Roques-carnes C., Tricot C., and Zucker S.W. Phys. Rev. A 39 3 (1989) 1500
7. Farin G. Curves and Surfaces for Computed-Aided Geometric Design - A Practical Guide. 4th Edition (1996), Academic Press, San Diego
8. Lopushenko V.V. Applied Math and Computer Science Faculty of the Moscow State University (1999), Vorob'yov Hills, Moscow
9. Bigerelle M., Van Gorp A., and Iost A. 10th International Conference on Metrology and Properties of Engineering Surface, Publications de l'Université de Saint-Etienne (2005) 69
10. Bennett J.M. Meas. Sci. Technol. 3 (1992) 1119
11. Jacobs S.D., Yang F., Fess E.M., Feingold J.B., Gillman B.E., Kordonski W.I., Edwards H., and Golini D. LLE Review 72 (1997) 197
12. Matsushita H., Ishida M., and Kikawa J. J. Cryst. Growth 103 1-4 (1990) 448