X-ray fluorescence microtomography analyzing reference samples

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 579, Issue 1, 2007, Pages 322-325

  Pereira, G R ^a   Lopes, R T ^a   Anjos, M J ^b   Rocha, H S ^a   Perez C A ^c  

^a FEDERAL UNIVERSITY OF RIO DE JANEIRO   (Brazil)

^b Physics Institute UERJ   (Brazil)

^c LABORATÓRIO NACIONAL DE LUZ SÍNCROTRON   (Brazil)

Author keywords

Microtomography; Reference samples; X ray fluorescence

Indexed keywords

COMPTON SCATTERING; FLUORESCENCE; LIGHT SOURCES; NONDESTRUCTIVE EXAMINATION; TOMOGRAPHY; X RAY ANALYSIS;

MICROTOMOGRAPHY; REFERENCE SAMPLES; TRANSMISSION MICROTOMOGRAPHY; X-RAY FLUORESCENCE;

CARRIER CONCENTRATION;

EID: 34547660585     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2007.04.069     Document Type: Article

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