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Volumn 72, Issue 1, 2007, Pages
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Extreme ultraviolet spectroscopy of highly charged argon ions at the Berlin EBIT
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Author keywords
[No Author keywords available]
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Indexed keywords
ARGON;
IONS;
SPECTROMETERS;
ARGON ION;
DATABASE INFORMATION;
ELECTRON BEAM ION TRAPS;
EXTREME ULTRAVIOLET RADIATIONS;
EXTREME ULTRAVIOLET SPECTROSCOPIES;
GRAZING-INCIDENCE SPECTROMETERS;
LINE LISTS;
LINE PREDICTION;
SOLAR LINES;
WAVELENGTH RANGES;
ULTRAVIOLET SPECTROSCOPY;
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EID: 34547644815
PISSN: 17426588
EISSN: 17426596
Source Type: Conference Proceeding
DOI: 10.1088/1742-6596/72/1/012004 Document Type: Article |
Times cited : (6)
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References (17)
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