Extreme high vacuum field emission microscope for study on the inherent fluctuation of field emission

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 25, Issue 4, 2007, Pages 1420-1423

  Cho, B ^a,b   Itagaki, T ^b   Ishikawa, T ^b   Rokuta, E ^b   Oshima, C ^b  

^a JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^b WASEDA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CURRENTS; FIELD EMISSION; HYDROGEN; VACUUM APPLICATIONS;

FE CURRENT; FLUCTUATIONS; HIGH VACUUM FIELD EMISSION MICROSCOPE; TIP SURFACE;

FIELD EMISSION MICROSCOPES;

EID: 34547595939     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.2757182     Document Type: Article

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