On-board sample cleaver

Review of Scientific Instruments

Volumn 78, Issue 7, 2007, Pages

  Mänsson, Martin ^a   Claesson, Thomas ^a   Karlsson, Ulf O ^a   Tjernberg, Oscar ^a   Pailh́s, St́phane ^b   Chang, Johan ^b   Mesot, Joël ^b   Shi, Ming ^c   Patthey, Luc ^c   Momono, Naoki ^d   Oda, Migaku ^d   Ido, Masayuki ^d  

^a ROYAL INSTITUTE OF TECHNOLOGY   (Sweden)

^b ETH ZURICH   (Switzerland)

^c PAUL SCHERRER INSTITUTE   (Switzerland)

^d HOKKAIDO UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

HIGH TEMPERATURE SUPERCONDUCTORS; LOW TEMPERATURE EFFECTS; MACHINE DESIGN; SAMPLING;

CLEAVING BLADES; RIGID SAMPLES; SAMPLE DESIGN;

CRYSTALLOGRAPHY;

ARTICLE; ELECTRONICS; EQUIPMENT; EQUIPMENT DESIGN; INSTRUMENTATION; LABORATORY DIAGNOSIS; MATERIALS TESTING; METHODOLOGY; MICROTOMY; REPRODUCIBILITY; SENSITIVITY AND SPECIFICITY; SYSTEM ANALYSIS;

EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; MATERIALS TESTING; MICROTOMY; MINIATURIZATION; REPRODUCIBILITY OF RESULTS; SENSITIVITY AND SPECIFICITY; SPECIMEN HANDLING; SYSTEMS INTEGRATION;

EID: 34547574333     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2756754     Document Type: Article

References (7)

1. Y. Saitoh, Rev. Sci. Instrum. 71, 3254 (2000).
2. C. Dallera, E. Puppin, G. Trezzi, N. Incorvaia, A. Fasana, L. Braicovich, N. B. Brookes, and J. B. Goedkoop, J. Synchrotron Radiat. 3, 231 (1996).
3. U. Flechsig, L. Patthey, and T. Schmidt, AIP Conf. Proc. 705, 316 (2004); http://sls.web.psi.ch/view.php/beamlines/sis/index.htm
4. U. Flechsig, L. Patthey, and T. Schmidt, AIP Conf. Proc. 705, 316 (2004); http://sls.web.psi.ch/view.php/beamlines/sis/index.htm
5. J. Chang, Phys. Rev. B 75, 224508 (2007).
6. M. Mnsson (unpublished).
7. J. Chang (unpublished).