Optical Aharonov-Bohm effect in stacked type-II quantum dots

Physical Review B - Condensed Matter and Materials Physics

Volumn 76, Issue 3, 2007, Pages

  Kuskovsky, Igor L ^a   MacDonald, W ^a   Govorov, A O ^b   Mourokh, L ^a   Wei, X ^c   Tamargo, M C ^d   Tadic, M ^e,f   Peeters, F M ^e  

^a CITY UNIVERSITY OF NEW YORK   (United States)

^b OHIO UNIVERSITY   (United States)

^c FLORIDA STATE UNIVERSITY   (United States)

^d CITY COLLEGE OF NEW YORK   (United States)

^e UNIVERSITY OF ANTWERP   (Belgium)

^f UNIVERSITY OF BELGRADE   (Serbia)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 34547565689     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.76.035342     Document Type: Article

References (28)

1. Y. Aharonov and D. Bohm, Phys. Rev. PHRVAO 0031-899X 10.1103/PhysRev.115. 485 115, 485 (1959).
2. M. Bayer, M. Korkusinski, P. Hawrylak, T. Gutbrod, M. Michel, and A. Forchel, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.90.186801 90, 186801 (2003).
3. P. Offermans, P. M. Koenraad, J. H. Wolter, D. Granados, J. M. Garcia, V. M. Fomin, V. N. Gladilin, and J. T. Devreese, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.2058212 87, 131902 (2005).
4. T. Kuroda, T. Mano, T. Ochiai, S. Sanguinetti, K. Sakoda, G. Kido, and N. Koguchi, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.72.205301 72, 205301 (2005).
5. B. Alen, J. Martinez-Pastor, D. Granados, and J. M. Garcia, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.72.155331 72, 155331 (2005).
6. S. Zaric, G. N. Ostojic, J. Kono, J. Shaver, and V. C. Moore, Science SCIEAS 0036-8075 10.1126/science.1096524 304, 1129 (2004).
7. A. V. Chaplik, JETP Lett. JTPLA2 0021-3640 62, 900 (1995).
8. B. C. Lee, O. Voskoboynikov, and C. P. Lee, Physica E (Amsterdam) PELNFM 1386-9477 10.1016/j.physe.2004.04.030 24, 87 (2004).
9. A. V. Kalameitsev, A. O. Govorov, and V. M. Kovalev, JETP Lett. JTPLA2 0021-3640 68, 669 (1998).
10. K. L. Janssens, B. Partoens, and F. M. Peeters, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.64.155324 64, 155324 (2001).
11. A. O. Govorov, S. E. Ulloa, K. Karrai, and R. J. Warburton, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.66.081309 66, 081309 (R) (2002).
12. J. I. Climente, J. Planelles, and W. Jaskólski, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.68.075307 68, 075307 (2003).
13. E. Ribeiro, A. O. Govorov, J. W. Carvalho, and G. Medeiros-Ribeiro, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.92.126402 92, 126402 (2004).
14. Y. Gu, I. L. Kuskovsky, M. van der Voort, G. F. Neumark, X. Zhou, and M. C. Tamargo, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.71.045340 71, 045340 (2005).
15. W. Lin, S. P. Guo, M. C. Tamargo, I. Kuskovsky, C. Tian, and G. F. Neumark, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.126297 76, 2205 (2000).
16. The results are obtained from high-resolution symmetrical and asymmetrical high-resolution x-ray diffraction (HRXRD) and will be published elsewhere. Briefly, the symmetric (004) HRXRD curves in the ω-2θ mode show a spectrum typical of multilayer samples. Superlattice (SL) satellites up to second order are observed; all observed SL satellites are distributed with nearly equal angular separation, suggesting well-defined overall periodicity along the growth direction. The structural parameters were extracted via theoretical simulations of HRXRD curves, based on dynamical diffraction theory. There are two significant findings related to this work: the average QD-layer thickness corresponds to submonolayer quantities of Te expected from the growth conditions and a higher Te Zn flux ratio results in a higher average Te composition in the QD layers. The data on a similar system can be found in Y. Gong, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.2184434 99, 064913 (2006).
17. F. Malonga, D. Bertho, C. Jouanin, and J. M. Jancu, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.52.5124 52, 5124 (1995).
18. S.-H. Wei and A. Zunger, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.53.R10457 53, R10457 (1996).
19. S.-H. Wei and A. Zunger, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.121249 72, 2011 (1998).
20. M. Tadic, F. M. Peeters, and K. L. Janssens, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.65.165333 65, 165333 (2002).
21. S. Lee, F. Michl, U. Rössler, M. Dobrowolska, and J. K. Furdyna, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.57.9695 57, 9695 (1998).
22. M. J. S. P. Brasil, R. E. Nahory, F. S. Turco-Sandroff, H. L. Gilchrist, and R. J. Martin, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.104859 58, 2509 (1991).
23. J. Sörgel and U. Scherz, Eur. Phys. J. B EPJBFY 1434-6028 10.1007/s100510050417 5, 45 (1998).
24. L. G. G. V. Dias da Silva, S. E. Ulloa, and A. O. Govorov, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.70.155318 70, 155318 (2004).
25. T. Schmidt, K. Lischka, and W. Zulehner, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.45.8989 45, 8989 (1992).
26. A. Trüby, M. Potemski, and R. Planel, Solid-State Electron. SSELA5 0038-1101 10.1016/0038-1101(95)00233-2 40, 139 (1996).
27. J. Haetty, M. Salib, A. Petrou, T. Schmiedel, M. Dutta, J. Pamulapati, P. G. Newman, and K. K. Bajaj, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.56. 12364 56, 12364 (1997).
28. Y. Gu, Igor L. Kuskovsky, M. van der Voort, G. F. Neumark, X. Zhou, M. Munoz, and M. C. Tamargo, Phys. Status Solidi B PSSBBD 0370-1972 10.1002/pssb.200304224 241, 515 (2004).