Noncontact charge measurement of moving microparticles contacting dielectric surfaces

Review of Scientific Instruments

Volumn 78, Issue 7, 2007, Pages

  Nesterov, Alexander ^a,b   Löffler, Felix ^b   König, Kai ^a,b   Trunk, Ulrich ^b   Leibe, Klaus ^a   Felgenhauer, Thomas ^a   Stadler, Volker ^a   Bischoff, Ralf ^a   Breitling, Frank ^a   Lindenstruth, Volker ^b   Hausmann, Michael ^b  

^a GERMAN CANCER RESEARCH CENTER DKFZ   (Germany)

^b UNIVERSITY OF HEIDELBERG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CHARGE MEASUREMENT; ELECTRIC CONTACTS; ELECTRIC GROUNDING; ELEMENTARY PARTICLES;

DIELECTRIC SURFACES; GROUNDED METAL WIRE PROBES; MICROPARTICLES; NONCONTACT CHARGE MEASUREMENT;

DIELECTRIC DEVICES;

MICROSPHERE;

ARTICLE; ELECTRICITY; ELECTROCHEMISTRY; EQUIPMENT; EQUIPMENT DESIGN; INSTRUMENTATION; MATERIALS TESTING; METHODOLOGY; REPRODUCIBILITY; SENSITIVITY AND SPECIFICITY; SURFACE PROPERTY;

ELECTROCHEMISTRY; ELECTROSTATICS; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; MATERIALS TESTING; MICROSPHERES; REPRODUCIBILITY OF RESULTS; SENSITIVITY AND SPECIFICITY; SURFACE PROPERTIES;

EID: 34547557655     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2756629     Document Type: Article

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