Breakdown and partial discharge measurements of some commonly used dielectric materials in liquid nitrogen for HTS applications

IEEE Transactions on Applied Superconductivity

Volumn 17, Issue 2, 2007, Pages 1513-1516

  James, D R ^a   Sauers, I ^a   Ellis, A R ^a   Tuncer, E ^a   Tekletsadik, K ^b   Hazelton, D W ^b  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b SUPERPOWER INC   (United States)

Author keywords

Cryogenic dielectrics; Dielectric breakdown; Partial discharge; Surface discharges

Indexed keywords

DIELECTRIC MATERIALS; DIELECTRIC PROPERTIES; HIGH TEMPERATURE SUPERCONDUCTORS; LIQUID NITROGEN; PARTIAL DISCHARGES; SURFACE DISCHARGES;

BREAKDOWN STRENGTH; CRYOGENIC DIELECTRICS; HTS APPLICATIONS; ONSET VOLTAGE;

ELECTRIC BREAKDOWN;

EID: 34547486456     PISSN: 10518223     EISSN: None     Source Type: Journal    
DOI: 10.1109/TASC.2007.898471     Document Type: Conference Paper

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