Characterization of backscattering Mueller matrix patterns of highly scattering media with triple scattering assumption

Optics Express

Volumn 15, Issue 15, 2007, Pages 9672-9680

  Yong, Deng ^a   Shaoqun, Zeng ^a   Qiang, Lu ^a   Dan, Zhu ^a   Qingming, Luo ^a  

^a HUAZHONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

BACKSCATTERING; CHARACTERIZATION; COMPUTER SIMULATION; ELECTROMAGNETIC WAVE SCATTERING; MONTE CARLO METHODS; POLYSTYRENES; SPHERES;

AZIMUTHAL STRUCTURE; MUELLER MATRIX; RADIAL DEPENDENCE; TRIPLE SCATTERING ASSUMPTION;

PATTERN RECOGNITION;

EID: 34547434335     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.15.009672     Document Type: Article

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