Investigation of dioctahedral smectite hydration properties by modeling of X-ray diffraction profiles: Influence of layer charge and charge location

American Mineralogist

Volumn 92, Issue 10, 2007, Pages 1731-1743

  Ferrage, Eric ^a,b,d   Lanson, Bruno ^a   Sakharov, Boris A ^c   Geoffroy, Nicolas ^a   Jacquot, Emmanuel ^b   Drits, Victor A ^c  

^a CNRS   (France)

^b ANDRA   (France)

^c GEOLOGICAL INSTITUTE   (Russian Federation)

^d Faculté des Sciences et Technologies   (France)

Author keywords

Beidellite; Hydration; Interstratification; Layer charge; Montmorillonite; Phyllosilicate; Smectite; XRD data

Indexed keywords

CLAY MINERALS; COHERENT SCATTERING; DIFFRACTION PATTERNS; ETHYLENE; ETHYLENE GLYCOL; HUMIDITY CONTROL; INTERFEROMETRY; LOCATION; MOLECULES; X RAY DIFFRACTION;

BEIDELLITE; INTERSTRATIFICATION; LAYER CHARGE; PHYLLOSILICATE; SMECTITES;

HYDRATION;

BEIDELLITE; HETEROGENEITY; HYDRATION; MODELING; MONTMORILLONITE; PARTICLE SIZE; PHYLLOSILICATE; RELATIVE HUMIDITY; SMECTITE; X-RAY DIFFRACTION;

EID: 34547401852     PISSN: 0003004X     EISSN: None     Source Type: Journal    
DOI: 10.2138/am.2007.2273     Document Type: Article

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