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Volumn 26, Issue 3, 2007, Pages 661-676

Influence of the discretization error on the reconstruction accuracy in electrical capacitance tomography

Author keywords

Capacitance; Electrical properties; Modelling; Non linear control systems

Indexed keywords

COMPUTER SIMULATION; ELECTRIC IMPEDANCE TOMOGRAPHY; INVERSE PROBLEMS; NONLINEAR CONTROL SYSTEMS; UNCERTAIN SYSTEMS; VOID FRACTION;

EID: 34547380956     PISSN: 03321649     EISSN: None     Source Type: Journal    
DOI: 10.1108/03321640710751136     Document Type: Article
Times cited : (10)

References (12)
  • 3
    • 32044449925 scopus 로고
    • Generalized cross-validation as a method for choosing a good ridge parameter
    • Golub, G.H., Heath, M. and Wahba, G. (1979), "Generalized cross-validation as a method for choosing a good ridge parameter", Technometrics, Vol. 21, pp. 215-23.
    • (1979) Technometrics , vol.21 , pp. 215-23
    • Golub, G.H.1    Heath, M.2    Wahba, G.3
  • 8
    • 0000739264 scopus 로고
    • On the solution of funtional equations by the method of regularization
    • Morozov, V.A. (1966), "On the solution of funtional equations by the method of regularization", Journal of Soviet Mathematics - Doklady, Vol. 7, pp. 414-7.
    • (1966) Journal of Soviet Mathematics - Doklady , vol.7 , pp. 414-7
    • Morozov, V.A.1
  • 10
    • 25644447578 scopus 로고    scopus 로고
    • Nonlinear image reconstruction for electrical capacitance tomography using experimental data
    • Soleimani, M. and Lionheart, W.R.B. (2005), "Nonlinear image reconstruction for electrical capacitance tomography using experimental data", Measurement Science and Technology, Vol. 16, pp. 1987-96.
    • (2005) Measurement Science and Technology , vol.16 , pp. 1987-96
    • Soleimani, M.1    Lionheart, W.R.B.2
  • 12
    • 0035387780 scopus 로고    scopus 로고
    • Status of electrical tomography in industrial applications
    • York, T. (2001), "Status of electrical tomography in industrial applications", Journal of Electronic Imaging, Vol. 10, pp. 608-19.
    • (2001) Journal of Electronic Imaging , vol.10 , pp. 608-19
    • York, T.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.