Electron turbulence at nanoscale junctions

Nano Letters

Volumn 7, Issue 6, 2007, Pages 1789-1792

  Bushong, Neil ^a   Gamble, John ^b   Ventra, Massimiliano Di ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b 931 College Mall   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON LIQUIDS; NANOSCALE JUNCTIONS; NANOSCALE SYSTEMS; NONLINEAR DYNAMICAL EFFECTS;

CHARACTERIZATION; ELECTRON TRANSPORT PROPERTIES; NONLINEAR ANALYSIS; REYNOLDS NUMBER; TURBULENT FLOW;

NANOSTRUCTURES;

NANOMATERIAL;

ARTICLE; CHEMICAL MODEL; CHEMICAL STRUCTURE; CHEMISTRY; COMPUTER SIMULATION; ELECTRON; ELECTRON TRANSPORT; METHODOLOGY; MICROELECTRODE; NANOTECHNOLOGY; NONLINEAR SYSTEM; PARTICLE SIZE; ULTRASTRUCTURE;

COMPUTER SIMULATION; ELECTRON TRANSPORT; ELECTRONS; MICROELECTRODES; MODELS, CHEMICAL; MODELS, MOLECULAR; NANOSTRUCTURES; NANOTECHNOLOGY; NONLINEAR DYNAMICS; PARTICLE SIZE;

EID: 34547352658     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl070935e     Document Type: Article

References (41)

1. Landauer, R. IBM J. Res. Dev. 1957, 1, 223.
2. Büttiker, M.; Imry, Y.; Landauer, R.; Pinhas, S. Phys. Rev. B 1985, 31, 6207.
3. Di Ventra, M.; Pantelides, S. T.; Lang, N. D. Phys. Rev. Lett. 2000, 84, 979.
4. Ventra, M.; Pantelides, S. T.; Lang, N. D. Phys. Rev. Lett. 2001, 86, 288.
5. Ventra, M.; Pantelides, S. T.; Lang, N. D. Appl. Phys. Lett. 2000, 76, 3448.
6. Emberly, E.; Kirezenow, G. Phys. Rev. B 1998, 58, 10911.
7. Prociuk, A.; Van Kuiken, B.; Dunietz, B. D. J. Chem. Phys. 2006, 125, 204717.
8. Taylor, J.; Guo, H.; Wang, J. Phys. Rev. B 2001, 63, 245407.
9. Damle, P. S.; Ghosh, A. W.; Datta, S. Phys. Rev. B 2001, 64, 201403-(R).
10. Xue, Y.; Datta, S.; Ratner, M. A. J. Chem. Phys. 2001, 115, 4292.
11. Palacios, J. J.; Pérez-Jiménez, A. J.; Louis, E.; San-Fabián, E.; Vergés, J. A. Phys. Rev. B 2002, 66, 035322.
12. Martin, P. C.; Schwinger, J. Phys. Rev. 1959, 115, 1342.
13. Vignale, G.; Ullrich, C. A.; Conti, S. Phys. Rev. Lett. 1997, 79, 4878.
14. Tokatly, I. V. Phys. Rev. B 2005, 71, 165104.
15. D'Agosta, R.; Di Ventra, M. J. Phys.: Condens. Matter 2006, 18, 11059.
16. Frisch, U. Turbulence; Cambridge University Press: Cambridge, 1995.
17. Landau, L. D.; Lifshitz, E. M. Fluid Mechanics, 2nd ed.; Pergamon Press: New York, 1987; Vol. 6.
18. Conti, S.; Vignale, G. Phys. Rev. B 1999, 60. 7966.
19. Di Ventra, M.; Lang, N. D. Phys. Rev. B 2002, 65, 045402.
20. Di Ventra, M.; Todorov, T. N. J. Phys.: Condens. Matter 2004, 16, 8025.
21. Bushong, N.; Sai, N.; Di Ventra, M. Nano Lett. 2005, 5, 2569.
22. Sai, N.; Bushong, N.; Hatcher, R.; Di Ventra, M. Phys. Rev. B 2007, 75, 115410.
23. Cheng, C.-L.; Evans, J. S.; Voorhis, T. V. Phys, Rev. B 2006, 74, 155112.
24. Popinet, S. J. Comput. Phys. 2003, 190, 572.
25. Topinka, M. A.; LeRoy, B. J.; Shaw, S. E. J.; Heller, E. J.; Westervelt, R. M.; Maranowski, K. D.; Gossard, A. C. Science 2000, 289, 2323.
26. Bushong, N.; Pershin, Y.; Di Ventra, M. In preparation.
27. D'Agosta, R.; Sai, N.; Di Ventra, M. Nano Lett. 2006, 6, 2935.
28. Huang, Z. F.; Xu, B. Q.; Chen, Y.-C.; Di Ventra, M.; Tao, N. J. Nano Lett. 2006, 6, 1240.
29. Tsutsui, M.; Kurokawa, S.; Sakai, A. Nunotechnology 2006, 17, 5334.
30. Smit, R. H. M.; Untiedt, C.; van Ruitenbeek, J. M. Nanotechnology 2004, 15, S472.
31. Kohn, W.; Sham, L. Phys. Rev. 1965, 140, A1133.
32. Zangwill, A.; Soven, P. Phys. Rev. Lett. 1980, 45, 204.
33. Runge, E.; Gross, E. K. U. Phys. Rev. Lett. 1984, 52, 997.
34. Ceperley, D. M.; Alder, B. J. Phys. Rev. Lett. 1980, 45, 566.
35. Perdew, J. P.; Zunger, A. Phys. Rev. B 1981, 23, 5048.
36. Tal-Ezer, H.; Kosloff, R. J. Chem. Phys. 1984, 81, 3967.
37. Each electrode is 51.8 Å wide in the x direction, and 22.4 Å long in the z direction of current flow (see Figure I). The width of the rectangular bridge is 2.8 Å, and the gap between the electrodes is 9.8 Å.
38. 33
39. 34 for constructing the time-evolution operator.
40. For the simulation of the Navier-Stokes equations, we use Dirchlet boundary conditions for the velocity at the inlet, and Neumann boundary conditions at the outlet.
41. The issue of compressibility is also related to the treatment of the fluid at the boundaries of the confining structure. In general, wavefunctions tend to exhibit exponentially decreasing density at the edges of a confining potential, while incompressible classical fluids are described with hard walls and "no-slip" boundary conditions. The assumption in the Naiver-Stokes equations that the electron liquid is incompressible also neglects the formation of surface charges; for a discussion of dynamical charging effects near nanoscopic junctions, see ref 20.