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Volumn 42, Issue 14, 2007, Pages 5875-5879
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Dielectric behavior of Cu-GeO2 cermet thin films
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Author keywords
[No Author keywords available]
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Indexed keywords
CERMETS;
DIELECTRIC LOSSES;
DIELECTRIC MATERIALS;
GERMANIUM COMPOUNDS;
MATHEMATICAL MODELS;
THIN FILMS;
DEPOSITION RATE;
DIELECTRIC LOSS MEASUREMENTS;
GOSWAMI AND GOSWAMI MODEL;
COPPER COMPOUNDS;
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EID: 34547341148
PISSN: 00222461
EISSN: 15734803
Source Type: Journal
DOI: 10.1007/s10853-006-1001-z Document Type: Article |
Times cited : (3)
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References (18)
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