CMOS image sensor with analog gamma correction using nonlinear single-slope ADC

Proceedings - IEEE International Symposium on Circuits and Systems

Volumn , Issue , 2006, Pages 3578-3581

  Ham, Seogheon ^a   Lee, Yonghee ^a   Jung, Wunki ^b   Lim, Seunghyun ^b   Yoo, Kwisung ^b   Youngcheol, Chae ^b   Cho, Jihyun ^b   Lee, Dongmyung ^b   Han, Gunhee ^b  

^a SAMSUNG Electronics   (South Korea)

^b Yonsei University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ANALOG TO DIGITAL CONVERSION; CMOS INTEGRATED CIRCUITS; GAIN MEASUREMENT; NONLINEAR SYSTEMS;

ANALOG GAMMA CORRECTION; LIGHT INTENSITY; LOGARITHMIC RESPONSES;

IMAGE SENSORS;

EID: 34547332842     PISSN: 02714310     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)

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3. S.K. Mendis, S.E. Kemeny, R.C. Gee, B. Pain, C.O. Staller, Q. Kim and E. R. Fossum, "CMOS active pixel image sensors for highly integrated imaging systems," IEEE J. Solid-State-Circuits, Vol. 32, pp.187-197, Feb. 1997.
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6. Oh-Bong Kwon, Ki-Nam Park, Do-Young Lee, Kang-Jin Lee, Sung-Chun Jun, Chan-Ki Kim, and W. Yang, "A novel double slope analog-to-digital converter for a high-quality 640×480 CMOS imaging system," ICVC 6th International Conference, pp. 335-338, Oct, 1999.