Critical length scales for the deformation of amorphous metals containing nanocrystals

Philosophical Magazine Letters

Volumn 87, Issue 8, 2007, Pages 603-611

  Lund, A C ^a,b   Schuh, C A ^a  

^a Massachusetts Institute of Technology Cambridge   (United States)

^b Xtalic Corporation   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS MATERIALS; DEFORMATION; DISLOCATIONS (CRYSTALS); INTERFACES (MATERIALS); NUCLEATION; SHEAR BANDS;

NANOCRYSTAL INTERIOR; NANOCRYSTALLINE INCLUSIONS; SHEAR BAND THICKNESS;

NANOCRYSTALS;

EID: 34547327594     PISSN: 09500839     EISSN: 13623036     Source Type: Journal    
DOI: 10.1080/09500830701422186     Document Type: Article

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