A novel characterization scheme for organic field-effect transistors

Journal of Physics D: Applied Physics

Volumn 40, Issue 12, 2007, Pages 3563-3566

  Dost, René ^a   Das, Arindam ^a   Grell, Martin ^a  

^a UNIVERSITY OF SHEFFIELD   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; CHARACTERIZATION; STANDARDS; THRESHOLD VOLTAGE;

FAST RESPONSE; MEASUREMENT ALGORITHMS; MODERATE MOBILITIES; ORGANIC FIELD-EFFECT TRANSISTOR (OFET);

FIELD EFFECT TRANSISTORS;

EID: 34547305016     PISSN: 00223727     EISSN: 13616463     Source Type: Journal    
DOI: 10.1088/0022-3727/40/12/003     Document Type: Article

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