Sophisticated models replicate the effects of tunnel junctions

Compound Semiconductor

Volumn 13, Issue 6, 2007, Pages 29-31

  Li, Z Q ^a   Li, Simon ^a  

^a Crosslight Software Inc   (Canada)

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Indexed keywords

EID: 34547301297     PISSN: 1096598X     EISSN: None     Source Type: Trade Journal    
DOI: None     Document Type: Article

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