The exponential repair assumption: Practical impacts

2007 Proceedings - Annual Reliability and Maintainability Symposium, RAMS

Volumn , Issue , 2007, Pages 125-130

  Carter, Charles M ^a,c   Malerich, Anthony W ^b,d  

^a ARINC Engineering Services   (United States)

^b Aspen Avionics ^*  (United States)

^c ARINC Engineering Services LLC   (United States)

^d Aspen Avionics   (United States)

Author keywords

Availability; Exponential distribution; Lognormal distribution; Mean time between downing events

Indexed keywords

EXPONENTIAL DISTRIBUTION; LOGNORMAL DISTRIBUTION; MEAN TIME BETWEEN DOWNING EVENTS;

REDUNDANCY; SENSITIVITY ANALYSIS; STATISTICAL METHODS;

ASYMPTOTIC STABILITY;

EID: 34547291793     PISSN: 0149144X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/RAMS.2007.328052     Document Type: Conference Paper

References (3)

1. K.E. Murphy, C.M. Carter, L.H. Wolfe, "How Long Should I Simulate, and for How Many Trials? A Practical Guide to Reliability Simulations", Proceedings Annual Reliability & Maintainability Symposium, (Jan.) 2001, pp. 207-212.
2. rd Edition, 2000.
3. K. E. Murphy, C. M. Carter, S. O. Brown, "The Exponential Distribution: the Good, the Bad and the Ugly. A Practical Guide to its Implementation", Proceedings Annual Reliability & Maintainability Symposium, (Jan.) 2002, pp. 550-555.