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Volumn 346, Issue , 2007, Pages 56-63

Dielectric properties of perovskite-type artificial superlattices

Author keywords

[No Author keywords available]

Indexed keywords

FILM THICKNESS; MOLECULAR BEAM EPITAXY; PERMITTIVITY; SPECTROSCOPIC ELLIPSOMETRY; SUPERLATTICES; X RAY DIFFRACTION ANALYSIS;

EID: 34547289726     PISSN: 00150193     EISSN: 15635112     Source Type: Conference Proceeding    
DOI: 10.1080/00150190601180240     Document Type: Conference Paper
Times cited : (12)

References (13)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.