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Volumn 346, Issue , 2007, Pages 56-63
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Dielectric properties of perovskite-type artificial superlattices
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Author keywords
[No Author keywords available]
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Indexed keywords
FILM THICKNESS;
MOLECULAR BEAM EPITAXY;
PERMITTIVITY;
SPECTROSCOPIC ELLIPSOMETRY;
SUPERLATTICES;
X RAY DIFFRACTION ANALYSIS;
ARTIFICIAL SUPERLATTICES;
DIELECTRIC PERMITTIVITY;
PEROVSKITE;
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EID: 34547289726
PISSN: 00150193
EISSN: 15635112
Source Type: Conference Proceeding
DOI: 10.1080/00150190601180240 Document Type: Conference Paper |
Times cited : (12)
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References (13)
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