First UHV surface studies of single-grain icosahedral Ag-In-Yb quasicrystal

Philosophical Magazine

Volumn 87, Issue 18-21, 2007, Pages 2989-2994

  Sharma, H R ^a,d   Shimoda, M ^a,b   Ohhashi, S ^c   Tsai, A P ^b,c  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^c TOHOKU UNIVERSITY   (Japan)

^d UNIVERSITY OF LIVERPOOL   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

QUASICRYSTALLINE LONG-RANGE ORDER; XPS DATA;

FOURIER TRANSFORMS; GRAIN SIZE AND SHAPE; HIGH ENERGY ELECTRON DIFFRACTION; IMAGE ANALYSIS; SCANNING TUNNELING MICROSCOPY; SILVER ALLOYS; X RAY PHOTOELECTRON SPECTROSCOPY;

QUASICRYSTALS;

EID: 34547286601     PISSN: 14786435     EISSN: 14786443     Source Type: Journal    
DOI: 10.1080/14786430701358640     Document Type: Conference Paper

References (6)

1. P.A. Thiel, Prog. Surf. Sci. 75 69 (2004).
2. V. Fournée and P.A. Thiel, J. Phys. D 38 R83 (2005).
3. R. McGrath, J. Ledieu, E.J. Cox, et al., J. Phys. Condensed Matter 14 R119 (2002).
4. H.R. Sharma, M. Shimoda and A.P. Tsai, Advances in Physics (2007) in press.
5. S. Ohhashi, J. Hasegawa, S. Takeuchi, et al., Phil. Mag. (2007), accepted.
6. P.A. Thiel, A.I. Goldman and C.J. Jenks, in Physical Properties of Quasicrystals, edited by Z.M. Stadnik (Springer, Berlin, 1999), and references therein.