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Volumn 98, Issue 22, 2007, Pages

Subsystem fault tolerance with the Bacon-Shor code

Author keywords

[No Author keywords available]

Indexed keywords

ERROR ANALYSIS; GAGES; MEASUREMENT THEORY; STOCHASTIC MODELS;

EID: 34547281253     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.98.220502     Document Type: Article
Times cited : (200)

References (17)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.