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Volumn 98, Issue 22, 2007, Pages
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Subsystem fault tolerance with the Bacon-Shor code
a,c b,c |
Author keywords
[No Author keywords available]
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Indexed keywords
ERROR ANALYSIS;
GAGES;
MEASUREMENT THEORY;
STOCHASTIC MODELS;
EFFICIENT METHODS;
QUANTUM ACCURACY;
SHOR CODE;
FAULT TOLERANCE;
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EID: 34547281253
PISSN: 00319007
EISSN: 10797114
Source Type: Journal
DOI: 10.1103/PhysRevLett.98.220502 Document Type: Article |
Times cited : (200)
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References (17)
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