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Volumn 75, Issue 5, 2007, Pages

Defect fluctuations and lifetimes in disordered Yukawa systems

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERIZATION; DEFECTS; HIGH TEMPERATURE EFFECTS; PHASE NOISE;

EID: 34547266480     PISSN: 15393755     EISSN: 15502376     Source Type: Journal    
DOI: 10.1103/PhysRevE.75.051407     Document Type: Article
Times cited : (4)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.