Determination of the particle sizes, microstrains, and degree of inhomogeneity in nanostructured materials from X-ray diffraction data

Glass Physics and Chemistry

Volumn 33, Issue 3, 2007, Pages 276-282

  Kurlov, A S ^a   Gusev, A I ^a  

^a INSTITUTE OF SOLID STATE CHEMISTRY   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

NANOCRYSTALLINE POWDERS; NANOSTRUCTURED MATERIALS; TUNGSTEN CARBIDE; X RAY DIFFRACTION;

DIFFRACTION REFLECTIONS; MICROSTRAINS;

PARTICLE SIZE;

EID: 34547260361     PISSN: 10876596     EISSN: None     Source Type: Journal    
DOI: 10.1134/S1087659607030169     Document Type: Article

References (18)

1. Krivoglaz, M.A., Teoriya rasseyaniya rentgenovskikh luchei i teplovykh neitronov real'nymi kristallami (Theory of X-Ray and Thermal Neutron Scattering by Real Crystals), Moscow: Nauka, 1967 [in Russian].
2. Rempel', A.A., Rempel', S.V., and Gusev, A.I., Quantitative Assessment of Homogeneity of Nonstoichiometric Compounds, Dokl. Akad. Nauk, 1999, vol. 369, no. 4, pp. 486-490
3. [Dokl. Phys. Chem. (Engl. transl.), 1999, vol. 369, no. 4-6, pp. 321-325].
4. Rempel, A.A. and Gusev, A.I., Preparation of Disordered and Ordered Highly Nonstoichiometric Carbides and Evaluation of Their Homogeneity, Fiz. Tverd. Tela (St. Petersburg), 2000, vol. 42, no. 7, pp. 1243-1249
5. [Phys. Solid State (Engl. transl.), 2000, vol. 42, no. 7, pp. 1280-1286].
6. Gusev, A.I. and Rempel, A.A., Nestekhiometriya, besporyadok i poryadok v tverdom tele (Nonstoichiometry: Disorder and Order in Solids), Yekaterinburg: Ural Division of the Russian Academy of Sciences, 2001 [in Russian].
7. Gusev, A.I., Rempel, A.A., and Magerl, A.J., Disorder and Order in Strongly Nonstoichiometric Compounds: Transition Metal Carbides, Nitrides, and Oxides, Berlin: Springer, 2001.
8. Gusev, A.I., Nanomaterialy, nanostruktury, nanotekhnologii (Nanomaterials, Nanostructures, and Nanotechnologies), Moscow: Fizmatlit, 2005 [in Russian].
9. Dasgupta, P., On Use of Pseudo-Voigt Profiles in Diffraction Line Broadening Analyses, Fizika A (Croatia), 2000, vol. 9, no. 2, pp. 61-66.
10. Puerta, J. and Martin, P., Three and Four Generalized Lorentzian Approximations for the Voigt Line Shape, Appl. Opt., 1981, vol. 20, no. 22, pp. 3923-3928.
11. Cagliotti, G., Paoletti, A., and Ricci, F.P., Choice of Collimators for a Crystal Spectrometer for Neutron Diffraction, Nucl. Instrum. Methods, 1958, vol. 3, no. 3, pp. 223-228.
12. Rietveld, H.M., A Profile Refinement Method for Nuclear and Magnetic Structures, J. Appl. Crystallogr., 1969, vol. 2, no. 2, pp. 65-71.
13. Scherrer, P., Bestimmung der Grösse und der inneren Struktur von Kolloidteilchen mittels Röntgenstrahlen, Nachr. Ges. Wiss. Göttingen, Math.-Phys. Kl., 1918, vol. 2, pp. 98-100.
14. Warren, B.E., Averbach, B.L., and Roberts, B.W., Atomic Size Effect in the X-Ray Scattering by Alloys, Appl. Phys., 1951, vol. 22, no. 1, pp. 1493-1496.
15. Williamson, G.K. and Hall, W.H., X-Ray Line Broadening from Filed Aluminium and Wolfram, Acta Metall., 1953, vol. 1, no. 1, pp. 22-31.
16. x. Solid Solutions, Neorg. Mater., 2003, vol. 39, no. 1, pp. 49-53
17. [Inorg. Chem. (Engl. transl.), 2003, vol. 39, no. 1, pp. 43-46].
18. Rempel', S.V., Gusev, A.I., and Rempel', A.A., A Method for Determining the Particle Size in Compacted and Dispersed Nanomaterials, in Fizikokhimiya ul'tradispersnykh (nano-) sistem (Physical Chemistry of Ultradisperse (Nano-)Systems), Moscow: Moscow Institute of Engineering Physics, 2003, pp. 378-384 [in Russian].