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Volumn 78, Issue 6, 2007, Pages

Quantitative extraction of spectral line intensities and widths from x-ray spectra recorded with gated microchannel plate detectors

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL SPECTROMETERS; ELLIPTICAL CRYSTAL; PLASMA SPECTROSCOPY; PLATE DETECTORS;

EID: 34547249344     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2748674     Document Type: Article
Times cited : (5)

References (13)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.