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Volumn 78, Issue 6, 2007, Pages
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Quantitative extraction of spectral line intensities and widths from x-ray spectra recorded with gated microchannel plate detectors
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Author keywords
[No Author keywords available]
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Indexed keywords
CRYSTAL SPECTROMETERS;
ELLIPTICAL CRYSTAL;
PLASMA SPECTROSCOPY;
PLATE DETECTORS;
LINEWIDTH;
MICROCHANNELS;
PHOTOELECTRON SPECTROSCOPY;
POISSON DISTRIBUTION;
SPECTROMETERS;
STATISTICS;
UNCERTAINTY ANALYSIS;
X RAY ANALYSIS;
RADIATIVE TRANSFER;
ARTICLE;
EQUIPMENT;
EQUIPMENT DESIGN;
INFORMATION RETRIEVAL;
INSTRUMENTATION;
METHODOLOGY;
REPRODUCIBILITY;
SENSITIVITY AND SPECIFICITY;
SPECTROMETRY;
STATISTICAL ANALYSIS;
TRANSDUCER;
DATA INTERPRETATION, STATISTICAL;
EQUIPMENT DESIGN;
EQUIPMENT FAILURE ANALYSIS;
INFORMATION STORAGE AND RETRIEVAL;
REPRODUCIBILITY OF RESULTS;
SENSITIVITY AND SPECIFICITY;
SPECTROMETRY, X-RAY EMISSION;
TRANSDUCERS;
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EID: 34547249344
PISSN: 00346748
EISSN: None
Source Type: Journal
DOI: 10.1063/1.2748674 Document Type: Article |
Times cited : (5)
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References (13)
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