Properties of signature change patterns

IEEE International Conference on Software Maintenance, ICSM

Volumn , Issue , 2006, Pages 4-13

  Kim, Sunghun ^a   James Whitehead Jr , E ^a   Bevan, Jennifer ^a  

^a University of California Santa Cruz   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CORRELATION METHODS; FUNCTION EVALUATION; PARAMETER ESTIMATION; SOFTWARE ENGINEERING;

SIGNATURE CHANGE PATTERNS; SOFTWARE PROJECTS;

ELECTRONIC DOCUMENT IDENTIFICATION SYSTEMS;

EID: 34547247823     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICSM.2006.47     Document Type: Conference Paper

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