Twin metric control - CUSUM simplified in a Shewhart framework

International Journal of Quality and Reliability Management

Volumn 14, Issue 3, 1997, Pages 220-233

  Marquardt, Donald W ^a  

^a Donald W Marquardt and Associates   (United States)

Author keywords

Average run length; Statistical process control

Indexed keywords

EID: 34547228928     PISSN: 0265671X     EISSN: None     Source Type: Journal    
DOI: 10.1108/02656719710165464     Document Type: Article

References (7)

1. Fellner, W.H. (1990), "Average run lengths for cumulative sum schemes" in Applied Statistics, Vol. 39, pp. 402-12.
2. Marquardt, D.W., Ulery, D.L. (1992), "Twin metric Control-improving SPC to meet supply chain realities of the 1990s" in Transactions of the 46th Annual Quality Congress, American Society for Quality Control, Milwaukee, WI, pp. 367-73.
3. Champ, C.W., Woodall, W.H. (1987), "Exact results for Shewhart control charts with supplementary runs rules" in Technometrics, Vol. 29, pp. 393-99.
4. Lucas, J.M. (1982), "Combined Shewhart - CUSUM quality control schemes" in Journal of Quality Technology, Vol. 14, pp. 51-9.
5. Bissell, A.F. (1986), "The performance of control charts and CUSUMs under linear trend", Applied Statistics, Vol. 35.
6. Marquardt, D.W. (1993), "Estimating the standard deviation for statistical process control" in International Journal of Quality & Reliability Management, Vol. 10, No. 8, pp. 57-64.
7. Wadsworth, H.M., Stephens, K.S., Godfrey, A.B (1986), Modern Methods for Quality Control and Improvement, John Wiley & Sons, New York, NY.