Self-calibration technique for reduction of hold failures in low-power nano-scaled SRAM

Proceedings - Design Automation Conference

Volumn , Issue , 2006, Pages 971-976

  Ghosh, Swaroop ^a   Mukhopadhyay, Saibal ^a   Kim, Keejong ^a   Roy, Kaushik ^a  

^a Purdue University   (United States)

Author keywords

Adaptive source biasing; Hold failures; Low power SRAM

Indexed keywords

ELECTRIC POTENTIAL; ELECTRIC POWER SYSTEMS; LEAKAGE CURRENTS; NANOSTRUCTURED MATERIALS;

ADAPTIVE SOURCE BIASING; HOLD FAILURES; LOW POWER SRAM; SRAM ARRAYS;

STATIC RANDOM ACCESS STORAGE;

EID: 34547226726     PISSN: 0738100X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/1146909.1147155     Document Type: Conference Paper

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