Ultra high sensitive detection of mechanical resonances of nanowires by field emission microscopy

Physica Status Solidi (A) Applications and Materials Science

Volumn 204, Issue 6, 2007, Pages 1645-1652

  Perisanu, S ^a   Vincent, P ^a   Ayari, A ^a   Choueib, M ^a,b   Guillot, D ^a   Bechelany, M ^b   Cornu, D ^b   Miele, P ^b   Purcell, S T ^a  

^a UNIVERSITÉ LYON 1   (France)

^b UNIVERSITÉ CLAUDE BERNARD LYON 1   (France)

Author keywords

[No Author keywords available]

Indexed keywords

IMAGE BLURRING; IMAGE DETECTION; MECHANICAL RESONANCES;

ELECTRIC FIELD EFFECTS; FIELD EMISSION MICROSCOPES; IMAGE ACQUISITION; IMAGE ANALYSIS; RESONANCE; SILICON CARBIDE;

NANOWIRES;

EID: 34547203627     PISSN: 18626300     EISSN: 18626319     Source Type: Journal    
DOI: 10.1002/pssa.200675333     Document Type: Conference Paper

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