Facial strain pattern as a soft forensic evidence

Proceedings - IEEE Workshop on Applications of Computer Vision, WACV 2007

Volumn , Issue , 2007, Pages

  Manohar, Vasant ^a   Goldgof, Dmitry ^a   Sarkar, Sudeep ^a   Yong, Zhang ^b  

^a UNIVERSITY OF SOUTH FLORIDA   (United States)

^b YOUNGSTOWN STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FACIAL STRAIN PATTERN; INTENSITY-BASED FACE RECOGNITION; PROSECUTION HYPOTHESIS;

ALGORITHMS; IDENTIFICATION (CONTROL SYSTEMS); MAXIMUM LIKELIHOOD;

FACE RECOGNITION;

EID: 34547193119     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/WACV.2007.23     Document Type: Conference Paper

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