메뉴 건너뛰기




Volumn 204, Issue 3, 2007, Pages 768-775

Physical properties of Bi-doped CdTe thin films deposited by cosputtering

Author keywords

[No Author keywords available]

Indexed keywords

BI CONTENT; CDTE TARGET; DIFFRACTION MEASUREMENTS; GLASS SUBSTRATES; ROOM TEMPERATURE;

EID: 34547184091     PISSN: 18626300     EISSN: 18626319     Source Type: Journal    
DOI: 10.1002/pssa.200622335     Document Type: Article
Times cited : (5)

References (18)
  • 4
    • 85176523912 scopus 로고    scopus 로고
    • D. J. Olego, J. P. Faurie, S.-Sivananthan, and P. M. Raccah, Appl. Phys. Lett. 47, 1172 (1985).
    • D. J. Olego, J. P. Faurie, S.-Sivananthan, and P. M. Raccah, Appl. Phys. Lett. 47, 1172 (1985).
  • 7
    • 0242507991 scopus 로고
    • Solid State Physics
    • edited by G. Hohler Springer, Berlin
    • R. Dornhaus and G. Nimtz, in: Solid State Physics, Springer Tracts in Modern Physics, edited by G. Hohler (Springer, Berlin, 1976), pp. 1-20.
    • (1976) Springer Tracts in Modern Physics , pp. 1-20
    • Dornhaus, R.1    Nimtz, G.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.