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Journal of Materials Science

Volumn 42, Issue 18, 2007, Pages 7673-7677

Misorientation behavior of an aluminum bicrystal with 15.7° symmetric tilt boundary using simple shear

(4) Kuo, Jui Chao a Chen, Delphic a Tung, Shih Heng b Shih, Ming Hsiang c

a NATIONAL CHENG KUNG UNIVERSITY (Taiwan)

b NATIONAL UNIVERSITY OF KAOHSIUNG (Taiwan)

c NATIONAL KAOHSIUNG UNIVERSITY OF APPLIED SCIENCES (Taiwan)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; BACKSCATTERING; ELECTRON DIFFRACTION; GRAIN BOUNDARIES; STRAIN MEASUREMENT;

ELECTRON BACKSCATTERING DIFFRACTION (EBSD); ORIENTATION GRADIENTS; SYMMETRIC TILT BOUNDARY;

BICRYSTALS;

EID: 34547182399 PISSN: 00222461 EISSN: 15734803 Source Type: Journal
DOI: 10.1007/s10853-007-1687-6 Document Type: Article

Times cited : (6)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.