Sensitivity of damage to microstructure evolution occurring during long-term high-temperature annealing in a semi-crystalline polymer

Journal of Materials Science

Volumn 42, Issue 18, 2007, Pages 7850-7860

  Castagnet, Sylvie ^a   Girard, David ^a,b  

^a CNRS   (France)

^b ARKEMA   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CRYSTALLIZATION; DIFFERENTIAL SCANNING CALORIMETRY; HIGH TEMPERATURE EFFECTS; POLYCRYSTALLINE MATERIALS; YIELD STRESS;

BURST RESISTANCE; MICROSTRUCTURE EVOLUTION; POLYVINYLIDENE FLUORIDES; YIELD STRESS REINFORCEMENT;

MICROSTRUCTURE;

EID: 34547161928     PISSN: 00222461     EISSN: 15734803     Source Type: Journal    
DOI: 10.1007/s10853-007-1620-z     Document Type: Article

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