TEM/SEM investigation of microstructural changes within the white etching area under rolling contact fatigue and 3-D crack reconstruction by focused ion beam

Scripta Materialia

Volumn 57, Issue 7, 2007, Pages 635-638

  Grabulov, A ^a,b   Ziese, U ^b   Zandbergen, H W ^b  

^a NETHERLANDS INSTITUTE FOR METALS RESEARCH   (Netherlands)

^b DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

Ion beam processing; Recrystallization; Rolling contact fatigue (RCF); Transmission electron microscopy (TEM)

Indexed keywords

CRACK RECONSTRUCTION; MARTENSITIC STRUCTURE; ROLLING CONTACT; WHITE ETCHING AREA (WEA);

CRACKS; ETCHING; FOCUSED ION BEAMS; MICROSTRUCTURAL EVOLUTION; NANOCRYSTALLINE MATERIALS; RECRYSTALLIZATION (METALLURGY); SCANNING ELECTRON MICROSCOPY;

FATIGUE OF MATERIALS;

EID: 34447647087     PISSN: 13596462     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.scriptamat.2007.06.024     Document Type: Article

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